Magnetic resonance in FeNi/Bi/FeNi films

Patrin, K. G.; Yarikov, S. A.; Yakovchuk, V. Yu.; Patrin, G. S.; Salomatov, Yu. P.; Plekhanov, V. G.

doi:10.1134/S1063785015110231

Author:

Patrin, K. G.

Yarikov, S. A.

Yakovchuk, V. Yu.

Patrin, G. S.

Salomatov, Yu. P.

Plekhanov, V. G.

Corporate Contributor:

Институт инженерной физики и радиоэлектроники

Кафедра общей физики

Date:

2015-11

Journal Name:

Technical Physics Letters

Journal Quartile in Scopus:

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Bibliographic Citation:

Patrin, K. G. Magnetic resonance in FeNi/Bi/FeNi films [Текст] / K. G. Patrin, S. A. Yarikov, V. Yu. Yakovchuk, G. S. Patrin, Yu. P. Salomatov, V. G. Plekhanov // Technical Physics Letters. — 2015. — Т. 41 (№ 11). — С. 1091-1093

Текст статьи не публикуется в открытом доступе в соответствии с политикой журнала.

Abstract:

The magnetic resonance in FeNi/Bi/FeNi trilayer films with nonmagnetic semimetal spacer has been experimentally studied. It is found that the microwave absorption spectrum of samples has a complicated shape dependent on the nonmagnetic spacer thickness. In the interval of Bi layer thicknesses within 3–15 nm, the interlayer coupling has an antiferromagnetic character. © 2015, Pleiades Publishing, Ltd.

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