Automated measuring unit for analysis of thin magnetic film ferroresonance spectrum
URI (for links/citations):
https://ieeexplore.ieee.org/document/8729594/keywords#keywordshttps://elib.sfu-kras.ru/handle/2311/128631
Date:
2019-04Journal Name:
2019 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON)Journal Quartile in Scopus:
без квартиляJournal Quartile in Web of Science:
без квартиляBibliographic Citation:
Burmitskikh, A. V. Automated measuring unit for analysis of thin magnetic film ferroresonance spectrum [Текст] / A. V. Burmitskikh, N. M. Boev, A. V. Izotov, V. G. Andyuseva // 2019 INTERNATIONAL SIBERIAN CONFERENCE ON CONTROL AND COMMUNICATIONS (SIBCON): IEEE International Siberian Conference on Control and Communications. — 2019.Текст статьи не публикуется в открытом доступе в соответствии с политикой журнала.
Abstract:
This paper considers hardware and software for automated analysis of thin magnetic film ferroresonance spectrum to determine the rate of growth and decrease in ferroresonance spectrum (conversion factor parameter). The measuring element of automated system is the strip line which is short-circuited. The measuring unit is used to study Ni80Fe20 permalloy films, with thickness of more than 300 Å. Conversion factor, magnetic permeability μ, uniaxial magnetic anisotropy, ferromagnetic spectrum resonance line width, saturation magnetization are analyzed from 50 MHz to 2 GHz frequency range. The magnetic films are used to design frequency selective filters, phase shifters and weak-field magnetic sensors. The thin magnetic film sensors are high sensitive magnetometers, with wide frequency range, low dimensions and weight [1].