Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films

O, A Maximova; N, N Kosyrev; S, N Varnakov; S, A Lyashchenko; I, A Tarasov; I, A Yakovlev; O, M Maximova; D, V Shevtsov; S, G Ovchinnikov

doi:10.1088/1742-6596/903/1/012060

Author:

O, A Maximova

N, N Kosyrev

S, N Varnakov

S, A Lyashchenko

I, A Tarasov

I, A Yakovlev

O, M Maximova

D, V Shevtsov

S, G Ovchinnikov

Corporate Contributor:

Инженерно-строительный институт

Институт фундаментальной биологии и биотехнологии

Кафедра строительных конструкций и управляемых систем

Кафедра водных и наземных экосистем

Date:

2017-10

Journal Name:

Journal of Physics: Conference Series

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Bibliographic Citation:

O, A Maximova. Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films [Текст] / A Maximova O, N Kosyrev N, N Varnakov S, A Lyashchenko S, A Tarasov I, A Yakovlev I, M Maximova O, V Shevtsov D, G Ovchinnikov S // Journal of Physics: Conference Series. — 2017. — Volume 903, conference 1. — С. 012060

Abstract:

In this work we present the way of nanostructured films study by means of magnetoellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time synthesis control is described. The method has been successfully tested on Fe/SiO2/Si nanostructures within the model of a homogeneous semi-infinite medium. As a result, the dielectric tensor components for Fe layer were calculated using a developed approach.

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