Показать сокращенную информацию
Analysis of regulatory documentation for thickness of coatings of materials and products
Автор | Sekatsky, V. S. | |
Автор | Gavrilova, O. A. | |
Автор | Merzlikina, N. V. | |
Автор | Pikalov, Y. A. | |
Автор | Kaposhko, I. A. | |
Дата внесения | 2021-08-13T09:33:55Z | |
Дата, когда ресурс стал доступен | 2021-08-13T09:33:55Z | |
Дата публикации | 2020-05 | |
Библиографическое описание | Sekatsky, V. S. Analysis of regulatory documentation for thickness of coatings of materials and products [Текст] / V. S. Sekatsky, O. A. Gavrilova, N. V. Merzlikina, Y. A. Pikalov, I. A. Kaposhko // Conference Series: Journal of Physics. — 2020. — Т. 1515 (№ 5). — С. 052025 | |
URI (для ссылок/цитирований) | https://iopscience.iop.org/article/10.1088/1742-6596/1515/5/052025 | |
URI (для ссылок/цитирований) | https://elib.sfu-kras.ru/handle/2311/143014 | |
Аннотация | It is shown that normalizing the thickness of coatings in the design of products and finding the actual value of the thickness of the coating layer with a given accuracy in manufacturing is a pressing task. An analysis of the regulatory documentation was carried out, which showed that there are recommendations for normalizing the thickness of the coating to select only the minimum thickness of the coating. The maximum thickness of the coatings is not regulated, which leads to unnecessary over expenditure of the coating material, energy and other costs and does not allow selecting the means of measuring the thickness of the coatings depending on accuracy. © Published under licence by IOP Publishing Ltd. | |
Тема | Environmental technology | |
Тема | Product design | |
Тема | Thickness measurement | |
Название | Analysis of regulatory documentation for thickness of coatings of materials and products | |
Тип | Journal Article | |
Тип | Journal Article Preprint | |
Страницы | 052025 | |
Дата обновления | 2021-08-13T09:33:55Z | |
DOI | 10.1088/1742-6596/1515/5/052025 | |
Институт | Политехнический институт | |
Подразделение | Кафедра стандартизации, метрологии и управления качеством | |
Журнал | Conference Series: Journal of Physics | |
Квартиль журнала в Scopus | Q3 | |
Квартиль журнала в Web of Science | без квартиля |