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N, V Koplyarova
Chzhan, E. A.
Medvedev, A. V.
Korneeva A.A
Kukartsev, V. V.
Tynchenko, V. S.
2020-01-20T07:57:39Z
2020-01-20T07:57:39Z
2019
N, V Koplyarova. Nonparametric algorithm of electronic components test data pattern recognition [Текст] / V Koplyarova N, E. A. Chzhan, A. V. Medvedev, Korneeva A.A, V. V. Kukartsev, V. S. Tynchenko // IOP Conf. Series: Materials Science and Engineering. — 2019. — № 537.
https://iopscience.iop.org/article/10.1088/1757-899X/537/4/042021/pdf
http://elib.sfu-kras.ru/handle/2311/129363
Nonparametric algorithm of electronic components test data pattern recognition
Journal Article
Published Journal Article
82.05.21
2020-01-20T07:57:39Z
Институт нефти и газа
Институт космических и информационных технологий
Кафедра технологических машин и оборудования нефтегазового комплекса
Кафедра информатики
IOP Conf. Series: Materials Science and Engineering
без квартиля
без квартиля


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