Automated measuring unit for analysis of thin magnetic film ferroresonance spectrum

Abstract

This paper considers hardware and software for automated analysis of thin magnetic film ferroresonance spectrum to determine the rate of growth and decrease in ferroresonance spectrum (conversion factor parameter). The measuring element of automated system is the strip line which is short-circuited. The measuring unit is used to study Ni80Fe20 permalloy films, with thickness of more than 300 Å. Conversion factor, magnetic permeability μ, uniaxial magnetic anisotropy, ferromagnetic spectrum resonance line width, saturation magnetization are analyzed from 50 MHz to 2 GHz frequency range. The magnetic films are used to design frequency selective filters, phase shifters and weak-field magnetic sensors. The thin magnetic film sensors are high sensitive magnetometers, with wide frequency range, low dimensions and weight [1].