Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions
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URI (для ссылок/цитирований):
https://doi.org/10.1038/s41598-020-61713-9https://elib.sfu-kras.ru/handle/2311/142897
Автор:
Mikhail N. Krakhalev
Oxana O. Prishchepa
Vitaly S. Sutormin
Rashid G. Bikbaev
Ivan V. Timofeev
Victor Ya. Zyryanov
Коллективный автор:
Институт инженерной физики и радиоэлектроники
Лаборатория нанотехнологий спектроскопии и квантовой химии
Кафедра общей физики
Лаборатория нанотехнологий, спектроскопии и квантовой химии
Дата:
2020-12Журнал:
Scientific ReportsКвартиль журнала в Scopus:
Q1Квартиль журнала в Web of Science:
Q1Библиографическое описание:
Mikhail N. Krakhalev. Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions [Текст] / Mikhail N. Krakhalev, Oxana O. Prishchepa, Vitaly S. Sutormin, Rashid G. Bikbaev, Ivan V. Timofeev, Victor Ya. Zyryanov // Scientific Reports. — 2020. — Т. 10 (№ 1). — С. 1-9Аннотация:
Electric-field-induced changes of the orientational structures of cholesteric liquid crystal layer with the tangential-conical boundary conditions have been investigated. The samples with the ratio of the cholesteric layer thickness d to the helix pitch p equalled to 0.57 have been considered. The perpendicularly applied electric field causes a decrease of the azimuthal director angle at the substrate with the conical surface anchoring. In the cells with d = 22 μm, the defect loops having the under-twisted and over-twisted areas are formed. At the defect loop the pair of point peculiarities is observed where the 180° jump of azimuthal angle of the director occurs. Under the action of electric field the loops shrink and disappear. In the cells with d = 13 μm, the over-twisted and under-twisted defect lines are formed. Applied voltage results in the shortening of lines or/and their transformation into a defect of the third type. The director field distribution near defect lines of three types has been investigated by the polarising microscopy techniques. It has been revealed that the length ratio between the over-twisted and third-type defect lines can be controlled by the electric field.