Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
URI (для ссылок/цитирований):
http://iopscience.iop.org/article/10.1088/1742-6596/903/1/012060/pdfhttps://elib.sfu-kras.ru/handle/2311/111160
Автор:
O, A Maximova
N, N Kosyrev
S, N Varnakov
S, A Lyashchenko
I, A Tarasov
I, A Yakovlev
O, M Maximova
D, V Shevtsov
S, G Ovchinnikov
Коллективный автор:
Инженерно-строительный институт
Институт фундаментальной биологии и биотехнологии
Кафедра строительных конструкций и управляемых систем
Кафедра водных и наземных экосистем
Дата:
2017-10Журнал:
Journal of Physics: Conference SeriesКвартиль журнала в Scopus:
Q3Квартиль журнала в Web of Science:
без квартиляБиблиографическое описание:
O, A Maximova. Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films [Текст] / A Maximova O, N Kosyrev N, N Varnakov S, A Lyashchenko S, A Tarasov I, A Yakovlev I, M Maximova O, V Shevtsov D, G Ovchinnikov S // Journal of Physics: Conference Series. — 2017. — Volume 903, conference 1. — С. 012060Аннотация:
In this work we present the way of nanostructured films study by means of magnetoellipsometry.
The method of interpretation of in situ magneto-optical ellipsometry spectra from
the in situ molecular beam epitaxy setup with an integrated magneto-ellipsometric real time
synthesis control is described. The method has been successfully tested on Fe/SiO2/Si
nanostructures within the model of a homogeneous semi-infinite medium. As a result, the
dielectric tensor components for Fe layer were calculated using a developed approach.