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Si/Fe flux ratio influence on growth and physical properties of polycrystalline β-FeSi2 thin films on Si(100) surface
Автор | Tarasov, I. A. | |
Автор | Visotin, M. A. | |
Автор | Alexandrovsky, A. S. | |
Автор | Kosyrev, N. N. | |
Автор | Yakovlev, I. A. | |
Автор | Molokeev, M. S. | |
Автор | Lukyanenko, A. V. | |
Автор | Krylov, A. S. | |
Автор | Fedorov, A. S. | |
Автор | Varnakov, S. N. | |
Автор | Ovchinnikov, S. G. | |
Дата внесения | 2019-07-01T07:27:08Z | |
Дата, когда ресурс стал доступен | 2019-07-01T07:27:08Z | |
Дата публикации | 2017-10 | |
Библиографическое описание | Tarasov, I. A. Si/Fe flux ratio influence on growth and physical properties of polycrystalline β-FeSi2 thin films on Si(100) surface [Текст] / I. A. Tarasov, M. A. Visotin, A. S. Alexandrovsky, N. N. Kosyrev, I. A. Yakovlev, M. S. Molokeev, A. V. Lukyanenko, A. S. Krylov, A. S. Fedorov, S. N. Varnakov, S. G. Ovchinnikov // Journal of Magnetism and Magnetic Materials. — 2017. — № 440. — С. 144-152 | |
ISSN | 03048853 | |
URI (для ссылок/цитирований) | https://www.sciencedirect.com/search?authors=Tarasov%20I.&pub=Journal%20of%20Magnetism%20and%20Magnetic%20Materials&cid=271615&volume=440&show=25&sortBy=relevance | |
URI (для ссылок/цитирований) | https://elib.sfu-kras.ru/handle/2311/110904 | |
Аннотация | This work investigates the Si/Fe flux ratio (2 and 0.34) influence on growth of β-FeSi2 polycrystalline thin films on Si(100) substrate at 630 ˚C. Lattice deformation for the films obtained are confirmed by X-ray diffraction analysis (XRD). The volume unit cell deviation from that of β-FeSi2 single crystal are 1.99 % and 1.1 % for Si/Fe = 2 and Si/Fe = 0.34, respectively. Absorption measurements show that the indirect transition (~ 0.813 eV) of the Si/Fe = 2 sample changes to the direct transition with a bandgap value of ~0.806 eV for the sample prepared at Si/Fe = 0.34. Along with this direct transition, the absorption spectra exhibit an additional feature with an excitation energy of ~0.56 eV. Surface magneto-optic Kerr effect (SMOKE) measurements detect ferromagnetic behavior of the β-FeSi2 polycrystalline films grown at Si/Fe = 0.34 at T=10 K, but no ferromagnetism was observed in the samples grown at Si/Fe = 2. Theoretical calculations refute that the cell deformation can cause the emergence of magnetization and argue that the origin of the ferromagnetism, as well as the lower impurity direct transition, is β-FeSi2 stoichiometry deviations. Raman spectroscopy measurements evidence that the film obtained at Si/Fe flux ratio equal to 0.34 has the better crystallinity than the Si/Fe = 2 sample | |
Тема | β-FeSi2 iron disilicide | |
Тема | optical properties | |
Тема | reflection high-energy electron diffraction | |
Тема | Raman spectroscopy | |
Тема | ab initio calculation | |
Название | Si/Fe flux ratio influence on growth and physical properties of polycrystalline β-FeSi2 thin films on Si(100) surface | |
Тип | Journal Article | |
Тип | Journal Article Preprint | |
Страницы | 144-152 | |
ГРНТИ | 29.19.04 | |
Дата обновления | 2019-07-01T07:27:08Z | |
DOI | 10.1016/j.jmmm.2016.12.084 | |
Институт | Институт инженерной физики и радиоэлектроники | |
Подразделение | Кафедра теоретической физики и волновых явлений | |
Журнал | Journal of Magnetism and Magnetic Materials | |
Квартиль журнала в Scopus | Q1 | |
Квартиль журнала в Web of Science | Q2 |