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Single-layer model of reflective nanostructures for magnetoellipsometry data analysis
In this work we present the method of magneto-ellipsometry data analysis. Magnetoellipsometry measurements are conducted in situ during nanostructures synthesis. Magnetic field is applied in configuration of magneto-optical ...
Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
In this work we present the way of nanostructured films study by means of magnetoellipsometry. The method of interpretation of in situ magneto-optical ellipsometry spectra from the in situ molecular beam epitaxy setup with ...